GEMV 510

The equipment utilizes the programmable structured grating technology to intelligently switch between fine stripes and high wide-range stripes, driving phase shift errors towards zero. With no mechanical transmission components and no wear, it significantly enhances the equipment’s detection capabilities and scope of application.

3D AOI uses optional 4+8 projection heads with PSLM multi-frequency projection capability to achieve the best inspection solution, covering all SMT/PTH/Semiconductor Applications. 

The problems of uneven images, uneven colors, and image distortion at the joints of FOV and FOV of typical AOI. 

3D AOI uses innovative AI intelligent seamless “jigsaw” technology to achieve a level that is indistinguishable to the naked eyes. It perfectly solves the problems of unevenness, unevenness, distortion, etc. in the FOV image “jigsaw’ seams of traditional AOI. It improves the positioning accuracy of the detection frame and reduces program debugging time.

3D AOI uses intelligent program editing methods and template-based parameter setting methods to facilitate quick programming and debugging.

3D AOI uses AI algorithm to perform one of its detection capabilities to inspect IC pins height. The actual height of the pin is measured purely in 3D mode and compared with the standard threshold to confirm whether it is a fault.  

Another example of AI algorithm to perform resistor color code detection.  

3D AOI adopts the self-developed enhanced multi-angle, multi-area, modulatable RGB+W+coaxial 2D light source design. It is suitable for the inspection of components, solder joints and text in various situations.  

Gem Vision 3D AOI versus Other typical 3D AOI